• Dr. Rajesh Purohit, Professor, Mechanical Engineering Department

• Dr. Fozia Z Haque, Associate Professor, Physics Department

• Dr. Raman Nateriya, Assistant Professor, Mechanical Engineering Department

• Dr. Vijay Kumar Bulasara, Associate Professor, Chemical Engineering Department

• Dr. Amit Ojha, Associate Professor, Electrical Engineering Department

• Dr. C. Sasi Kumar, Associate Professor, Metallurgical and Material Engineering Department

• Dr. Khushhali M. Pandey, Associate Professor, Biological Science and Engineering

• Dr. Bharat K. Modhera, Associate Professor, Chemical Engineering Department

• Dr. Dharmendra Pandey, Assistant Professor, Chemical Engineering Department

• Dr. Dharmendar Sharma, Assistant Professor, Chemistry Department

• Dr. Piyush Kumar Patel, Assistant Professor, Physics Department

• Dr. Jyoti Rani, Assistant Professor, Physics Department

• Dr. Rupak Kishore, Assistant Professor, Chemical Engineering Department

• Dr. Ram Kishore, Assistant Professor, Metallurgical and Material Engineering Department

• Dr. Sunder Lal Pal, Associate Professor, Chemical Engineering Department

• Dr. Sanjay Srivastava, Professor, Metallurgical and Material Engineering Department

• Dr. Sukanti Behera, Assistant Professor, Chemistry Department

• Dr. Arvind Kumar, Assistant Professor, Mechanical Engineering Department

• Dr. Narendra Laxman Gajbhiye, Assistant Professor, Mechanical Engineering Department

• Dr. Sudhanshu Kumar, Assistant Professor, Mechanical Engineering Department

• Dr. Rutuja M. Chavan, Assistant Professor, Civil Engineering Department

• Mr. Harish Vaidya, Deputy Registrar (Store & Purchase)

• Mr. Rakesh Singh (Storekeeper)

Confocal Raman Microscope

Raman spectroscopy is an analytical technique where scattered light is used to measure the vibrational energy modes of a sample. It is named after the Indian physicist Dr. C.V. Raman who, together with his research partner K.S Krishnan, was the first to observe Raman scattering in 1928. Raman spectroscopy can provide both chemical and structural information, as well as the identification of substances through their characteristic Raman ‘fingerprint’. Raman spectroscopy extracts this information through the detection of Raman scattering from the sample.

Confocal Raman Microscopy: Confocal Raman Microscopy combines the spectral information from Raman spectroscopy with the spatial filtering of a confocal optical microscope for high resolution chemical imaging of samples. The spectral Raman information is sensitive to the vibrational modes of the sample and provides extensive chemical, physical and structural insight, while the confocal optics of the microscope enables the analysis volume within the sample to be spatially filtered with high resolution in both the lateral (XY) and axial (Z) axes. The synergy between the spectral information enables the chemical analysis of individual particles, discrete sample features or layers down to less than 1um in size.

Model Name – CTR 300-S/C-x

Make: TechnoS Instruments, Jaipur India.

The Confocal Raman Microscope consists of two lasers i.e. 532nm and 785nm for Raman characterization. Other items to the above are aberration corrected Czerny-Turner single spectrograph, 3 gratings for CTR 300. Window based computer with a data collection and processing software. Entrance slit: 10 μm - 3.0 mm, RS232C/USB, optical fibre of 2m. Spectra repeatability <0.1cm^-1, Spectra Scan linearity <0.5cm^-1. Spectrum Range: 200 – 2100 nm, Raman Shift: 50 – 5000cm^-1.

    Optical Microscope ST-/LV/Ti (INV)

Confocal Raman optical microscope with < l/2 spatial resolution (<500nm standard using x100) objective lens, Raman probe with Raman Filter set, halogen light (ref/trans), Objective lens : x5, x10, x20, x50, x100 (Oil immersed) & CCD colour video camera variable spot size up to 300 μm (WAC).

Imaging Spectrograph

                                               Focal Length   Spectral Resolution      Gratings    Raman Range

CTR 300-S/C-x   F/4.1               300                <0.4 cm^-1/pixel                     3           50-5000 cm^-1

Characterization charges of Confocal Raman Microscope at CRF

Field Emission Electron Microscope

Field Emission Scanning Electron Microscopy (FESEM) is a technique that uses electrons to create images of materials and study their surface topography. FESEM is also known as a cold cathode field emitter because it doesn't use heat.

Basic principle: 

The technique in which electrons are used in place of light to take the image is known as electron microscopy. Electron microscopy is of two types, i.e., scanning electron microscopy (SEM) and field emission scanning electron microscopy. FESEM differs from SEM in the type of emitter; in SEM, a thermionic emitter is used, while in FESEM, a field emitter is used.

As the name suggests, thermionic emitters use heat to eject the electrons, and when the heat overcomes the work function, electrons are ejected, but the intensity is low and materials evaporate easily. In the field emitter ejection, these limitations are removed. In FESEM, the filament is placed in the high electric potential gradient to generate the electrons.

Generally, tungsten (W) wire is used for the production of electrons. This technique does not use heat so it is also known as a cold cathode field emitter. The electron beam is focused on the sample and the beam obtained after electron-sample interactions contains all the information related to chemical composition, morphology (texture), crystalline structure, and orientation of the material. It is one of the best techniques to uncover the surface structure, morphology, and composition of the sample. It provides a high-quality three-dimensional surface image of the material with high resolutions. The advantage of high resolution is that the closely lying different particles can be easily pointed out by enhancing the magnification.

Energy dispersive spectroscopy

Energy-dispersive X-ray spectroscopy (also known as EDS, EDX, or EDXA) is a powerful technique that enables the user to analyze the elemental composition of a desired sample. The major operating principle that allows EDS to function is the capacity of high energy electromagnetic radiation (X-rays) to eject 'core' electrons (electrons that are not in the outermost shell) from an atom. This principle is known as Moseley's Law, which determined that there was a direct correlation between the frequency of light released and the atomic number of the atom.

Removing these electrons from the system will leave behind a hole that a higher energy electron can fill in, and it will release energy as it relaxes. The energy released during this relaxation process is unique to each element on the periodic table, and as such bombarding a sample with X-rays can be used to identify what elements are present, as well as what proportion they are present in.

Shown below is an example of how EDS works. The letters K, L, and M refer to the n value that electrons in that shell have (K electrons, closest to the nucleus, are n=1 electrons), while α and β indicate the size of the transition. The relaxation from M to L or L to K are therefore described as Lα or Kα, while going from M to K would be a Kβ transition. The means that are used for describing these processes as a whole are known as Siegbahn notation.

● Energy dispersive spectroscopy (EDS) detector is attached to the system to find out the composition of the samples which uses eZAF correction.

● Element detection range of EDS varies from Be (4) - Am (253) with 70mm² SDD window with peltier cooling.

Instrument details

Instrument Model: CLARA 

Make of FESEM: TESCAN, Czech Republic

Specifications:

• Accelerating Voltage: 0.2keV - 30keV
• Lens Configuration: Condenser Lens – 2 Stage, IML – 1 stage, Objective Lens – 1 Stage.
• Magnification: 20X – 2000KX
• SEI Resolution: 0.9nm @ 15KeV

Sample preparation for FESEM:

·Medium for dispersion Ethanol /Methanol / Water /Iso-propyl alcohol. Any other medium should be provided by the user. Dispersion will be done by ultrasonication.

· Kindly mark the edge of the sample to be observed for Cross section.

·Base of the sample should be flat for mounting on sample holder.

·Biological samples will be accepted only after primarily fixation with suitable fixative.

·Samples should be in dry form. Hydrated samples must be dried properly before sending. 

·Sample preparation if any should be done at user end (cutting the sample for CS, freeze fracturing, sample fixation for biological samples, staining of samples, oven drying should be done by the user).

·The samples should withstand high vacuum (~ 10 -5 Pa). Wet samples can’t be done in FEG-SEM

·Any solid structures like in FESEM within a Maximum range of sample size of approx 12.5mm dia and 80mm height is acceptable. Bring Fresh CD for FESEM which should not be used for other equipment’s data.

Characterization charges of Field Emission Electron Microscope (FESEM) at CRF

BET Surface Area Analyzer

Instrument model: BELSORP- MINI X (BELSORP – series) from Microtrac BEL Corp

Brunauer-Emmett-Teller (BET) surface area analyzer is a non-destructive technique that is based on the BET theory which demonstrates the physical adsorption of the gas molecules (adsorptive) on a solid/porous surface (sample). BET theory is an extension of the Langmuir theory from monolayer adsorption to multilayer adsorption of adsorptive onto the adsorbent. In this technique, an inert gas such as nitrogen flows continuously over a solid sample which is suspended in a defined gaseous volume through the sample cell. Now, the small molecules of the inert gas adsorb to the surface of the sample and in its inner pore’s surface through Vander Waals forces. The amount of gas adsorbed depends mainly on the exposed surface area of the materials and also on the factors such as temperature, gas pressure, and degree of strength of interaction between the gas molecules and solid surface. The rate of adsorption can be used to calculate the specific surface area of a solid material. This instrument is capable to measure the adsorption/desorption isotherms, surface area (Langmuir and BET), pore size (BJH method), pore size distribution, and pore volume of the sample.

BET specific surface areas from 0.01 m²/g ~ (N₂) and pore size distribution from 0.7 ~ 500 nm (option: 0.35 ~ 500 nm by molecular probe method). Up to 3 specimens can be measured simultaneously, enabling the measurement times for multiple sampl

Instrument model: BELCAT II from Microtrac BEL Corp.

The chemisorption process involves the creation of strong electronic bonds between adsorbate molecules and certain surface locations, which are known as surface active sites. Chemisorption is irreversible and involves more heat than physical adsorption. Chemisorption catalyst analyser BELCAT can evaluate catalysis by using the following methods; Temperature Programmed Desorption spectrum measurement (TPD), Temperature Programmed Reaction spectrum measurement (TP Reaction), Temperature Programmed Reduction spectrum measurement (TP Reduction), Temperature Programmed Oxidation spectrum measurement (TPO), Metal dispersion measurement, Pulse injection measurement, and Single-point BET method to measure the specific area of samples. The BELCAT can be programmed automatically to do pre-treatment of the samples, measurement, and calculations. The study related to the acidity and basicity of the solid samples can also perform with this instrument.

Sample specifications

1. Only solid porous samples (powder) are allowed in the equipment.

2. 100 mg (minimum)

(Suggestion: please carry enough sample)

Limitation

1. Liquids samples are not allowed to run.

2. Samples should not melt or deteriorate inside the cell holder during characterization.

Characterization charges of BET Surface Area Analyzer at CRF

es to be shortened significantly & up-to 6 samples can be degassed simultaneously at temperature from Rt to 400 Deg C.

Gas Chromatography/ Mass Spectrometry (GCMS/MS)

Gas chromatography – mass spectrometry (GC-MS/MS) is an analytical method that combines the feature of gas – chromatography and mass spectrometry to identify different substances within a test sample. Applications of GC-MS include drug detection, fire investigation, environmental analysis, explosives investigations, food and flavor analysis, and identification of unknown samples, including that of material samples obtained from planet Mars during probe missions as early as the 1970s. GC – MS can also be used in the airport security to detect substances in luggage or on human beings. Additionally, it can identify trace elements in materials that were previously thought to have disintegrated beyond identification. Like liquid chromatography – mass spectrometry, it allows analysis and detection even of tiny amounts of a substance.

Instrument Model: GCMS-TQ8050 NX, Make: Shimadzu

Sample preparation:

For GC-MS sample preparation, user has to use a simple filtration technique to remove solid particles and inorganic salts if you are using a reaction mixture. The solution must be very diluted (0.1 mg/mL). It is recommended that your analyte must have a molecular weight of less than 500 g/mol. Only organic compounds are allowed for characterization in GCMS.

Characterization charges of GCMS/MS at CRF

Note: In addition to the above charges, GST @ 18% will be charged extra.

Contact Person: Mr. Prashast Manglik

                            Technical Officer, CRF

                            Email Id: prashast@manit.ac.in     

                            Office Tel: +91- 755-4051006

(Goods and Service Tax 18 % w.e.f. 1^st July 2017) 

 No Postal Charges for any analysis.

1. Dispatch address will be same as address on letter head.
2. GST is applicable to all the users and is calculated as per current rate 18% (w.e.f. from 1^st July 2017).
3. All the samples should accompany the payment receipt, in order to be considered for booking. All the payments should be in favour of "ICSC, MANIT Bhopal". In case of electronic transfer details must be submitted to the account section for verification.
4. The payment should be rounded off the nearest figure (integer value). 
   Example: If total charges (including tax etc) comes out to be Rs.169.67/- (i.e. greater than or equal to 50 paisa) then the amount should be rounded off to Rs.170/- but if the total charges (including tax etc) comes out to be Rs.169.47/-(i.e. less than 50 paisa) then the amount should be rounded off to Rs.169/-
5. Requesting letter exactly as it is: "Content of this report/bill is meant for our information only and we will not use the content of this report for advertisement, evidence, litigation or quote as certificate to third party". The technical report is conforming to the sample provided by the party, and this report is not submitted for any court of law.
6. Results will be available either in softcopy sent through e-mail or hardcopy needs to be collected from CRF office. Results will not be sent through post.
7. All the users are required to submit MSDS (Material Safety Data Sheets) for each sample they submit and a certificate stating that the samples submitted are non- toxic / non-hazardous inflammable and that the sample does not require special precaution while handling. Email sent to Coordinator/Members/Others will not be entertained.